Hierarchical low-rank and sparse tensor micro defects decomposition by electromagnetic thermography imaging system

Tongle Wu1, Bin Gao1, Wai Lok Woo2

  • 1Department of Automation Engineering, University of Electronic Science and technology, Chengdu, People's Republic of China.

Summary

This study introduces a new tensor decomposition method for detecting defects using electromagnetic induction thermography. The advanced algorithm effectively identifies weak defect signals amidst noise for improved non-destructive testing.

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