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Atomic-Layer-Deposited TiO Nanolayers Function as Efficient Hole-Selective Passivating Contacts in Silicon Solar
Takuya Matsui1, Martin Bivour2, Martin Hermle2
1Global Zero Emission Research Center, National Institute of Advanced Industrial Science and Technology (AIST), 1-1-1 Umezono, Tsukuba, Ibaraki 305-8568, Japan.
ACS Applied Materials & Interfaces
|October 22, 2020
Summary
Titanium oxide nanolayers function as efficient hole-selective contacts for silicon solar cells, achieving over 20% efficiency. This discovery offers new possibilities for semiconductor device passivation and contacts.
Area of Science:
- Materials Science
- Semiconductor Physics
- Renewable Energy
Background:
- Titanium oxide (TiO) is typically known as an electron-selective contact in semiconductor devices.
- Its function is attributed to a lower energy barrier for electrons compared to holes at the TiO/semiconductor interface.
Purpose of the Study:
- To investigate the antithetic function of titanium oxide nanolayers as hole-selective contacts.
- To demonstrate efficient surface passivation and hole extraction in silicon devices using TiO.
- To explore the potential for high-efficiency solar cells utilizing this novel contact.
Main Methods:
- Growth of ~5 nm titanium oxide nanolayers via atomic layer deposition (ALD) on crystalline silicon (Si) substrates.
- Fabrication of proof-of-concept solar cells using both n-type and p-type Si absorbers.
- Analysis of interfacial layers (TiOSi:H and SiO:H) and manipulation through ALD process and post-treatments (atomic hydrogen, oxygen annealing).
Main Results:
- Demonstrated titanium oxide nanolayers acting as efficient hole-selective contacts with excellent surface passivation.
- Achieved power conversion efficiencies exceeding 20% for proof-of-concept solar cells.
- Identified the critical role of interfacial layer composition (TiOSi:H, SiO:H) in enabling efficient hole extraction and passivation.
Conclusions:
- Titanium oxide nanolayers exhibit an antithetic function, serving as effective hole-selective passivating contacts.
- The composition of the TiO/Si interface, controllable via ALD and post-treatments, is key to performance.
- This finding presents an opportunity to replace conventional heterocontacts and dielectric passivation layers in various semiconductor devices.

