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Updated: Dec 1, 2025

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Implementation of a Reference Interferometer for Nanodetection
Published on: April 26, 2014
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High-speed range and velocity measurement using frequency scanning interferometry with adaptive delay lines
Summary
This study presents a frequency scanning interferometer for precise measurement of target range, displacement, and velocity. It achieves sub-nanometer displacement resolution and sub-100-nm range resolution using a novel adaptive delay line.
Area of Science:
- Optical Metrology
- Interferometry
- Laser Technology
Background:
- Accurate measurement of target range, displacement, and velocity is crucial in various scientific and industrial applications.
- Traditional interferometry methods face challenges in achieving high resolution and broad measurement ranges.
Purpose of the Study:
- To develop and demonstrate a frequency scanning interferometer for high-resolution, wide-range measurement of target motion.
- To improve measurement accuracy and reduce modulation frequencies using an adaptive delay line.
Main Methods:
- Utilized a frequency scanning interferometer with a vertical-cavity surface-emitting laser (100 nm tuning range, 100,000 scans/s).
- Incorporated an adaptive delay line in the reference beam to reduce modulation frequencies to sub-gigahertz levels.
- Determined range, displacement, and velocity from the interference signal's phase, with fine alignment from a reference interferometer.
Main Results:
- Achieved sub-nanometer displacement resolution.
- Demonstrated sub-100-nm range resolution.
- Obtained velocity resolution of 12µms⁻¹ over a 300 mm depth measurement range.
Conclusions:
- The developed frequency scanning interferometer offers high precision for measuring target motion.
- The adaptive delay line effectively reduces modulation frequencies, enhancing system performance.
- This technology has potential applications in precision engineering, scientific research, and industrial inspection.

