Dynamic Effects in Voltage Pulsed Atom Probe

Loïc Rousseau1,2, Antoine Normand1, Felipe F Morgado3

  • 1Groupe Physique des Matériaux, Université de Rouen, Saint Etienne du Rouvray, Normandie76800, France.

Summary

Atom probe tomography (APT) can now better analyze light elements in materials. Simulations reveal dynamic effects impacting mass resolution and spatial precision, offering insights for improved instrument performance.

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