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Updated: Nov 30, 2025

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics
Published on: January 19, 2018
Dynamic Effects in Voltage Pulsed Atom Probe
Loïc Rousseau1,2, Antoine Normand1, Felipe F Morgado3
1Groupe Physique des Matériaux, Université de Rouen, Saint Etienne du Rouvray, Normandie76800, France.
Atom probe tomography (APT) can now better analyze light elements in materials. Simulations reveal dynamic effects impacting mass resolution and spatial precision, offering insights for improved instrument performance.
Area of Science:
- Materials Science
- Analytical Chemistry
- Physics
Background:
- Atom probe tomography (APT) excels at nanoscale analysis of metallic alloys.
- It is crucial for quantifying light elements, which are challenging for electron/X-ray methods.
- These elements significantly influence material properties in high-strength alloys and semiconductors.
Purpose of the Study:
- To investigate the theoretical performance of commercial atom probe tomography instruments for light element analysis.
- To understand the impact of dynamic effects on mass resolution and spatial precision.
- To explore methods for optimizing APT performance for light elements.
Main Methods:
- Accurate three-dimensional transient electrostatic simulations using a time-varying field approach.
- Comparison of simulation results with experimental measurements on an FeBSi bulk-metallic glass.
- Analysis of multi-hit mass-to-charge correlations to reveal ion flight dynamics.
Main Results:
- Simulations revealed significant differences in ion projection based on mass, impacting spatial precision.
- Dynamic effects during ion flight were identified and shown to influence mass resolution.
- The study demonstrated that voltage pulse shaping can mitigate detrimental dynamic effects.
Conclusions:
- Theoretical simulations provide critical insights into APT performance for light elements.
- Dynamic effects and chromatic aberrations are key factors limiting precision for light elements.
- Optimizing voltage pulse shapes can enhance the accuracy and spatial resolution of APT for light element analysis.
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