A sensitivity leap for X-band EPR using a probehead with a cryogenic preamplifier

Mantas Šimėnas1, James O'Sullivan1, Christoph W Zollitsch1

  • 1London Centre for Nanotechnology, University College London, London WC1H 0AH, UK.

Summary

This study introduces an upgraded X-band Electron Paramagnetic Resonance (EPR) probehead with a cryogenic preamplifier. The enhanced sensitivity significantly reduces measurement time for EPR experiments.