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speckle-tracking: a software suite for ptychographic X-ray speckle tracking
Andrew J Morgan1,2, Kevin T Murray3, Harry M Quiney2
1Center for Free-Electron Laser Science, DESY, Notkestrasse 85, 22607 Hamburg, Germany.
Summary
New software enhances X-ray speckle-tracking for wavefront metrology and imaging. This robust tool, utilizing ptychographic X-ray speckle-tracking, offers rapid characterization of X-ray optics and samples.
Area of Science:
- Optics and Photonics
- X-ray Science
- Computational Imaging
Background:
- X-ray speckle-tracking techniques are valuable for wavefront metrology and imaging.
- These methods offer high angular sensitivity and compatibility with various X-ray sources.
- Existing techniques require rapid and robust software for full capability realization.
Purpose of the Study:
- To develop a software suite for the ptychographic X-ray speckle-tracking technique.
- To enable rapid and robust characterization of X-ray optical elements and sample properties.
- To provide an accessible and efficient software solution for advanced X-ray imaging.
Main Methods:
- Development of a software suite in Python 3.
- Implementation of an OpenCL back end for GPU and multi-CPU core processing.
- The software supports ptychographic X-ray speckle-tracking for highly divergent wavefields.
Main Results:
- The developed software suite provides rapid and robust processing for X-ray speckle-tracking.
- It enables detailed characterization of X-ray optical elements, focal spots, and sample properties.
- The software is accessible via Python module, command line, and GUI.
Conclusions:
- The software suite effectively addresses the need for rapid and robust processing in X-ray speckle-tracking.
- It enhances the capabilities of ptychographic X-ray speckle-tracking for advanced applications.
- The open-source availability promotes wider adoption and further development in the field.

