speckle-tracking: a software suite for ptychographic X-ray speckle tracking

Andrew J Morgan1,2, Kevin T Murray3, Harry M Quiney2

  • 1Center for Free-Electron Laser Science, DESY, Notkestrasse 85, 22607 Hamburg, Germany.

Journal of Applied Crystallography
|December 11, 2020
PubMed
Summary

New software enhances X-ray speckle-tracking for wavefront metrology and imaging. This robust tool, utilizing ptychographic X-ray speckle-tracking, offers rapid characterization of X-ray optics and samples.

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