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Time-resolved RIXS experiment with pulse-by-pulse parallel readout data collection using X-ray free electron laser.

H Lu¹, A Gauthier¹, M Hepting¹

¹Stanford Institute for Materials and Energy Sciences, SLAC National Accelerator Laboratory, Stanford University, 2575 Sand Hill Road, Menlo Park, CA, 94025, USA.

Scientific Reports

|December 18, 2020

Summary

This summary is machine-generated.

Time-resolved resonant inelastic X-ray scattering (RIXS) using X-ray free electron lasers (FELs) faces challenges due to FEL jitter and low signal yield. Pulse-by-pulse analysis with advanced detectors is crucial for future RIXS measurements.

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Published on: April 17, 2018

Area of Science:

Condensed Matter Physics
X-ray Science
Materials Science

Background:

Time-resolved resonant inelastic X-ray scattering (RIXS) is an emerging technique.
X-ray free electron lasers (FELs) enable advanced X-ray measurements.
FEL jitter is an inherent challenge in self-amplified spontaneous emission.

Purpose of the Study:

To evaluate the impact of FEL jitter on time-resolved RIXS measurements.
To assess the performance of a microchannel plate (MCP) based Timepix detector for RIXS.
To investigate RIXS at the Ti L3-edge on TiSe2.

Main Methods:

Utilized a microchannel plate (MCP) based Timepix soft X-ray detector.
Conducted time-resolved RIXS measurements at the Ti L3-edge.
Performed pulse-by-pulse data acquisition and analysis.

Main Results:

Less than 2% of X-ray FEL pulses yielded usable signals.
FEL jitter, low spectrometer efficiency, and low RIXS quantum yield limited data statistics.
Achieving sufficient data statistics while maintaining temporal and energy resolution was challenging.

Conclusions:

Current X-ray FEL limitations hinder time-resolved RIXS data acquisition.
Future MHz-class X-ray FELs (e.g., European XFEL, LCLS-II) are needed.
Advanced detectors, like the Timepix prototype, are essential for RIXS improvements.