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Optical vector analyzer with time-domain analysis capability.

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    This study introduces an optical vector analyzer using time-domain analysis (TDA) for precise optical device measurement. The novel system achieves high-resolution characterization of multiple devices within a single setup.

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    Area of Science:

    • Optoelectronics
    • Optical Metrology
    • Signal Processing

    Background:

    • Time-domain analysis (TDA) is crucial for characterizing optical devices and systems.
    • Existing methods may lack the resolution or capability to analyze multiple devices sequentially.

    Purpose of the Study:

    • To propose and experimentally demonstrate an optical vector analyzer with integrated TDA capabilities.
    • To enable precise measurement and diagnosis of individual optical devices within a complex system.

    Main Methods:

    • Generation of a low-coherence optical carrier via acousto-optic modulation of a continuous-wave laser.
    • Utilization of optical single-sideband modulation and vector balanced detection for comprehensive frequency response measurement.
    • Application of inverse Fourier transform and time-domain gating for isolating and analyzing individual device responses.

    Main Results:

    • Successful experimental demonstration of the proposed optical vector analyzer.
    • Characterization of a fiber link with three devices under test and a gas cell.
    • Achieved frequency setting resolution of 5 MHz and demonstrated time-domain resolution of 30.84 ns, with a theoretical limit of 14.881 ns.

    Conclusions:

    • The developed optical vector analyzer effectively utilizes TDA for high-resolution characterization of optical systems.
    • The method allows for the distinct analysis of multiple devices, offering significant advantages in optical metrology and diagnostics.