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Related Concept Videos

MOSFET01:16

MOSFET

The Metal-Oxide-Semiconductor Field-Effect Transistor (MOSFET) plays a pivotal role in modern electronics thanks to its versatility and efficiency in controlling electrical currents. This device, also known as IGFET, MISFET, and MOSFET, has three main terminals: the Source, Drain, and Gate. MOSFETs are classified into n-channel or p-channel types based on the doping characteristics of their substrate and the source or drain regions.
In an n-MOSFET, the structure includes n-type source and drain...
Small-Signal Analysis of MOSFET Amplifiers01:23

Small-Signal Analysis of MOSFET Amplifiers

In small-signal analysis, a MOSFET transistor amplifier acts as a linear amplifier when operating in its saturation region. The gate-to-source voltage (VGS) of the MOSFET is the sum of the DC biasing voltage and the small time-varying input signal. This combination sets up the operating point and modulates the drain current (ID) that flows from the drain to the source. When a small AC signal is superimposed on the DC bias voltage at the gate, the instantaneous drain current comprises three...
Biasing of FET01:22

Biasing of FET

Biasing a Junction Field Effect Transistor (JFET) is crucial for setting operational parameters and ensuring efficient functioning in electronic circuits. JFETs are characterized by using a single carrier type in N-channel or P-channel configurations, where the channel is surrounded by PN junctions. These junctions are central to the device's ability to control current flow.
In an N-channel JFET, the structure consists of N-type material forming the channel on a P-type substrate, with the gate...

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MOSFET dose measurements for proton SOBP beam.

Chun-Hui Hsing1, Luu Dang Hoang Oanh2, Tsi-Chian Chao3

  • 1Medical Physics Research Center, Institute for Radiological Research, Chang Gung University and Chang Gung Memorial Hospital, Guishan Dist., Taoyuan City 333, Taiwan; Particle Physics and Beam Delivery Core Laboratory, Institute for Radiological Research, Chang Gung University/Chang Gung Memorial Hospital, Guishan, Taoyuan 333, Taiwan.

Physica Medica : PM : an International Journal Devoted to the Applications of Physics to Medicine and Biology : Official Journal of the Italian Association of Biomedical Physics (AIFB)
|January 19, 2021
PubMed
Summary

This study developed a computational method to correct Metal-Oxide-Semiconductor Field-Effect Transistor (MOSFET) responses in proton therapy. This ensures accurate dose verification for spread-out Bragg peak beams, improving quality assurance.

Keywords:
Dose-weighted correction factorLET dependenceMOSFET dosimeterRecombination effectResidual range

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Area of Science:

  • Medical Physics
  • Radiation Oncology
  • Dosimetry

Background:

  • Proton therapy utilizes spread-out Bragg peaks (SOBP) for precise dose delivery.
  • Metal-Oxide-Semiconductor Field-Effect Transistors (MOSFETs) are used for dose measurements but exhibit dependence on Linear Energy Transfer (LET).
  • Correcting MOSFET response to LET variations is crucial for accurate dosimetry in proton beams.

Purpose of the Study:

  • To develop a computational scheme for correcting LET dependence in MOSFET response for SOBP proton beams.
  • To enable accurate dose measurements in water phantoms using MOSFET detectors.

Main Methods:

  • Investigated LET dependence of MOSFETs, attributing it to the stopping power ratio of SiO2 to H2O and fractional hole yield.
  • Derived formulas for dose-weighted correction factors using literature stopping power values and measured fractional hole yields.
  • Applied derived formulas to a clinical 190-MeV proton SOBP beam.

Main Results:

  • Computed dose-weighted correction factors for a clinical 190-MeV proton SOBP beam.
  • Predicted MOSFET outputs using correction factors for a beam composed of weighted monoenergetic Bragg peaks.
  • Observed good agreement between predicted and measured MOSFET responses.

Conclusions:

  • Applying LET-dependent correction factors to MOSFET data allows for accurate dose verification in proton therapy.
  • This method enhances the quality assurance of dosimetry using MOSFET measurements.
  • Facilitates reliable dose verification for clinical proton beam applications.