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Using Diffuse Scattering to Observe X-Ray-Driven Nonthermal Melting.

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High-intensity X-rays rapidly transform silicon into a disordered, liquid-like state within 100 femtoseconds. This unique phase change, driven by Coulomb forces, differs significantly from traditional liquid silicon.

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Area of Science:

  • Materials Science
  • Condensed Matter Physics
  • X-ray Science

Background:

  • Understanding material phase transitions under extreme conditions is crucial.
  • Previous studies lacked the temporal resolution to observe rapid structural changes.
  • Investigating electron heating effects on ionic structure requires advanced techniques.

Purpose of the Study:

  • To observe and characterize the ionic structural changes in silicon induced by intense X-ray heating.
  • To determine the timescale and nature of the phase transition.
  • To probe the disordered, liquid-like state of silicon formed by X-ray irradiation.

Main Methods:

  • Utilized the SPring-8 Angstrom Compact free electron Laser (SCeLA) facility.
  • Employed a high-intensity (∼10^20 W/cm^2) X-ray pump X-ray probe scheme.
  • Analyzed diffuse scattering signals, avoiding Laue spots, from a single crystalline silicon sample.

Main Results:

  • Observed a rapid increase in diffuse scattering within 100 femtoseconds (fs) of irradiation.
  • Identified a transition to a disordered, liquid-like state with a structure distinct from conventional liquid silicon.
  • The observed disordering timescale aligns with first-principles simulations and is faster than inertial predictions.

Conclusions:

  • The rapid phase transition and disordered state are primarily governed by Coulomb forces.
  • The X-ray pump X-ray probe method effectively probes the liquid structure without interference from the ambient solid.
  • This technique allows for detailed measurement of liquid structure during and after phase transitions.