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Quantifying the Robustness of Topological Slow Light.
Guillermo Arregui1, Jordi Gomis-Bresco1, Clivia M Sotomayor-Torres1,2
1Catalan Institute of Nanoscience and Nanotechnology (ICN2), CSIC and BIST, Campus UAB, Bellaterra, 08193 Barcelona, Spain.
Physical Review Letters
|January 29, 2021
Summary
We calculated the backscattering mean free path (ξ) for topological photonic waveguides. This metric, along with the group index (n_{g}), is crucial for assessing slow light robustness against imperfections.
Area of Science:
- Photonics
- Condensed Matter Physics
- Nanotechnology
Background:
- Slow light in photonic waveguides enables novel functionalities but is susceptible to scattering losses.
- The backscattering mean free path (ξ) quantifies resistance to imperfections, determining transmission quality.
- Understanding scattering is vital for nanoscale optical device performance.
Purpose of the Study:
- To calculate the backscattering mean free path (ξ) for topological photonic waveguides.
- To investigate the influence of disorder and group index (n_{g}) on ξ.
- To establish criteria for comparing topological and conventional slow-light transport robustness.
Main Methods:
- Theoretical calculation of the backscattering mean free path (ξ).
- Analysis considering specific disorder levels and fixed group index (n_{g}).
- Comparative analysis of topological versus nontopological waveguides.
Main Results:
- The backscattering mean free path (ξ) was determined for topological waveguides under specific conditions.
- Both disorder and group index (n_{g}) significantly impact the robustness of slow light.
- A fixed group index (n_{g}) is essential for meaningful comparisons of ξ.
Conclusions:
- Accurate quantification of slow-light robustness requires considering both ξ and n_{g}.
- Claims of superior performance for topological waveguides must account for these metrics.
- This work provides a framework for evaluating nanoscale slow-light transport.

