Comprehensive vector analysis for electro-optical, opto-electronic, and optical devices.

Area of Science:

• Photonics and Optical Engineering
• Device Characterization
• Modulation Techniques

Background:

• High-performance electro-optical (E-O), opto-electronic (O-E), and optical (O-O) devices are crucial for optical communications, microwave photonics, and fiber sensors.
• Accurate measurement of amplitude and phase responses is essential for developing and fabricating these photonic devices.
• Existing characterization methods struggle to analyze devices with arbitrary responses.

Purpose of the Study:

• To propose a comprehensive vector analyzer for characterizing E-O, O-E, and O-O devices with arbitrary responses.
• To overcome the limitations of previous measurement techniques in photonic device analysis.
• To enable detailed assessment of devices used in advanced optical applications.

Main Methods:

• Development of a vector analyzer utilizing optical asymmetrical double-sideband (ADSB) modulation.
• ADSB modulation addresses frequency aliasing issues by extracting information from both +1st and -1st order sidebands.
• Experimental validation using a commercial photodetector (O-E), phase modulator (E-O), and sampled fiber Bragg grating (FBG) (O-O).

Main Results:

• The proposed ADSB vector analyzer successfully characterized O-E, E-O, and O-O devices.
• Achieved a frequency resolution of 2 MHz.
• Demonstrated an electrical sweeping range of 40 GHz and an optical sweeping range of 80 GHz.

Conclusions:

• The ADSB-based vector analyzer provides a comprehensive solution for characterizing a wide range of photonic devices, including phase modulators.
• This technique enhances the ability to analyze devices with complex and arbitrary responses.
• The achieved performance metrics indicate significant advancements in photonic device measurement capabilities.