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GaN-based complementary inverter logic gate using InGaN/GaN superlattice capped enhancement-mode
Jaya Jha1, Swaroop Ganguly1, Dipankar Saha1
1Department of Electrical Engineering, Indian Institute of Technology Bombay, Powai, Mumbai-400076, India.
Nanotechnology
|April 26, 2021
Summary
This study introduces a novel Gallium Nitride (GaN)-based complementary transistor using an InGaN/GaN superlattice (SL) structure. This innovation enables high-speed logic operations, overcoming previous limitations in GaN electronics.
Area of Science:
- Materials Science
- Semiconductor Physics
- Electronics Engineering
Background:
- Gallium Nitride (GaN)-based High Electron Mobility Transistors (HEMTs) show promise for radio-frequency and high-power applications.
- Developing reliable enhancement-mode n-transistors and p-transistors for logic gates remains a significant challenge due to conflicting fabrication requirements.
- Existing methods for n-transistor enhancement-mode operation involve complex techniques like barrier thinning and charged oxides.
Purpose of the Study:
- To propose and analyze a novel GaN-based complementary field-effect transistor device.
- To demonstrate the feasibility of creating both enhancement-mode n-transistors and p-transistors on the same substrate.
- To evaluate the performance of GaN complementary logic gates for high-speed applications.
Main Methods:
- Utilizing a p-doped Indium Gallium Nitride/Gallium Nitride (InGaN/GaN) superlattice (SL) structure on the HEMT heterostructure.
- Analyzing the electrostatic changes induced by the SL, including the formation of a two-dimensional hole gas (2DHG).
- Simulating a digital inverter gate using the proposed complementary transistor structure to assess performance parameters.
Main Results:
- An undoped SL structure effectively converts the n-transistor to enhancement-mode (E-mode) by raising the conduction band-edge.
- The SL structure naturally creates a quantum well for holes, facilitating the p-transistor.
- P-doping the SL further optimizes E-mode n-transistor performance and enhances hole density in the p-transistor.
- Simulations show potential for very high-speed logic operations with low propagation delay.
Conclusions:
- The proposed InGaN/GaN superlattice structure provides a viable pathway for realizing complementary field-effect transistors in GaN.
- This approach overcomes the challenges of fabricating both n- and p-type transistors on a single substrate.
- The developed GaN complementary transistors offer significant potential for next-generation high-speed logic electronics.
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