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Related Experiment Video

Updated: Nov 7, 2025

Quantitative Hardness Measurement by Instrumented AFM-indentation
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A Fast Shape-from-Focus-Based Surface Topography Measurement Method.

Jona Gladines1, Seppe Sels1, Johan Blom1

  • 1Faculty of Applied Engineering, University of Antwerp, 2020 Antwerp, Belgium.

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|April 30, 2021
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Summary
This summary is machine-generated.

This study introduces a faster, two-step shape-from-focus 3D profilometry method. By using a coarse scan first, it significantly reduces data capture and processing time for accurate 3D measurements.

Keywords:
3D reconstructionlaser triangulationoptical dimensional metrologyshape from focusshape recovery

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Area of Science:

  • Metrology
  • Optical Engineering
  • Computer Vision

Background:

  • Shape from focus (SFF) is an accurate 3D profilometry technique.
  • SFF is often time-consuming due to extensive data capture and processing requirements.
  • Existing methods like laser triangulation and fringe projection offer faster alternatives but may have different accuracy trade-offs.

Purpose of the Study:

  • To develop a novel two-step shape-from-focus approach to accelerate 3D measurement speed.
  • To reduce the overall data acquisition and processing time for SFF techniques.
  • To maintain or improve the accuracy of 3D profilometry while enhancing speed.

Main Methods:

  • A two-step measurement strategy combining a fast profilometry technique with SFF.
  • Utilizing a coarse measurement from a faster technique to guide SFF data capture.
  • Limiting the number of frames captured by SFF based on the initial coarse measurement.
  • Comparing the proposed method's accuracy against conventional SFF using a high-accuracy reference.

Main Results:

  • The proposed two-step method achieved a significant improvement in measurement speed.
  • An overall reduction of 46% in measurement time was observed on a custom target.
  • The accuracy of the accelerated method was validated against the conventional SFF and a reference standard.

Conclusions:

  • The two-step shape-from-focus approach effectively accelerates 3D profilometry.
  • This method offers a practical solution for faster, accurate 3D measurements.
  • The technique demonstrates potential for broader applications in metrology and inspection.