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Related Concept Videos

Atomic Emission Spectroscopy: Overview01:20

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Atomic emission spectroscopy (AES) is an analytical technique used to determine the elemental composition of a sample by analyzing the light emitted from excited atoms. In AES, atoms in a sample are excited to higher energy levels by thermal energy from high-temperature sources, such as plasma, arcs, or sparks. When these excited atoms return to lower energy states, they emit light at specific wavelengths characteristic of each element. The resulting atomic emission spectrum, which consists of...
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AES is a powerful analytical technique, especially effective when used with plasma sources, producing abundant spectra in characteristic emission lines. The Inductively Coupled Plasma (ICP), in particular, yields superior quantitative analytical data due to its high stability, low noise, low background, and minimal interferences under optimal experimental conditions. However, newer air-operated microwave sources are emerging as promising alternatives that could be more cost-effective than...
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Different methods, such as visual observance of metal-ion indicators, spectroscopic techniques, and potentiometric methods, can determine the endpoint of an EDTA titration.
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Inductively coupled plasma (ICP) is the common plasma source used in atomic emission spectroscopy (AES), a technique that detects and analyzes various elements in a sample. This method is often called inductively coupled plasma atomic emission spectroscopy (ICP-AES).
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Atomic Absorption Spectroscopy: Radiation and Light Sources01:13

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Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
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An improved PD-AsLS method for baseline estimation in EDXRF analysis.

Qingxian Zhang1, Hui Li1, Hongfei Xiao1

  • 1Chengdu University of Technology, Chengdu, Sichuan 610000, China. lynn@stu.cdut.edu.cn and Applied Nuclear Techniques in Geosciences Key Laboratory of Sichuan Province, Chengdu, Sichuan 610000, China.

Analytical Methods : Advancing Methods and Applications
|May 6, 2021
PubMed
Summary
This summary is machine-generated.

A new Poisson distribution-based asymmetrically reweighted penalized least squares (PD-AsLS) method reliably corrects X-ray spectra baselines. This method outperforms others, showing high accuracy and stability for energy-dispersive X-ray fluorescence analysis.

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Area of Science:

  • Analytical Chemistry
  • Spectroscopy

Background:

  • Baseline correction is crucial in energy-dispersive X-ray fluorescence (EDXRF) analysis.
  • Existing methods like AsLS, airPLS, and arPLS have parametric sensitivity issues.
  • X-ray energy spectra possess unique statistical characteristics that necessitate tailored baseline correction.

Purpose of the Study:

  • To propose a novel asymmetrically reweighted penalized least squares method based on the Poisson distribution (PD-AsLS) for automatic X-ray spectra baseline correction.
  • To evaluate the accuracy and reliability of the PD-AsLS method.
  • To compare PD-AsLS with existing classical methods.

Main Methods:

  • Monte Carlo (MC) simulation to generate background spectra.
  • PD-AsLS algorithm to estimate the baseline of simulated background spectra.
  • Calculation of relative and absolute errors, correlation coefficient (COR), and root mean square error (RMSE) for accuracy assessment.
  • Experimental validation using repeated measurements and comparison with arPLS, airPLS, and AsLS.

Main Results:

  • PD-AsLS achieved a COR above 0.95 and RMSE less than 6 in simulations.
  • Experimental results demonstrated PD-AsLS's stability, with a lower coefficient of variation (CV) than measured spectra.
  • PD-AsLS showed superior baseline estimation compared to arPLS, without overestimation.

Conclusions:

  • PD-AsLS reliably estimates X-ray spectra baselines.
  • The method effectively suppresses statistical fluctuations in spectra.
  • PD-AsLS offers an improved approach for baseline correction in EDXRF analysis.