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Uncertainty in Large-Signal Measurements Under Variable Load Conditions
Konstanty Łukasik1, Jerome Cheron2, Gustavo Avolio3
1Department of Electrical Engineering, University of Leuven, 3000 Leuven, Belgium, and also with the Institute of Electronic Systems, Department of Electronics and Information Technology, Warsaw University of Technology, 00-665 Warsaw, Poland.
None:
We investigate the uncertainty of large-signal measurements of a microwave transistor due to variation in the load conditions at the fundamental frequency. In particular, we evaluate uncertainties in the complex frequency-domain traveling voltage waves. In our analysis, uncertainty sources typical for large-signal measurements are considered. Then, we discuss how the resultant uncertainty in the waves is dependent on a varying load reflection coefficient. For this investigation, we consider the total uncertainty of the waves and their magnitude and phase. We also show that these errors unavoidably affect the uncertainty of performance quantities, such as output power.
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