Search research articles

ABOUT JoVE

Overview Leadership Blog JoVE Help Center

AUTHORS

Publishing Process Editorial Board Scope & Policies Peer Review FAQ Submit

LIBRARIANS

Testimonials Subscriptions Access Resources Library Advisory Board FAQ

RESEARCH

JoVE Journal Methods Collections JoVE Encyclopedia of Experiments Archive

EDUCATION

JoVE Core JoVE Business JoVE Science Education JoVE Lab Manual Faculty Resource Center Faculty Site

Terms & Conditions of Use

Related Concept Videos

Multimachine Stability

Multimachine Stability

Multimachine stability analysis is crucial for understanding the dynamics and stability of power systems with multiple synchronous machines. The objective is to solve the swing equations for a network of M machines connected to an N-bus power system.
In analyzing the system, the nodal equations represent the relationship between bus voltages, machine voltages, and machine currents. The nodal equation is given by:

Uncertainty in Measurement: Reading Instruments

Uncertainty in Measurement: Reading Instruments

Counting is the type of measurement that is free from uncertainty, provided the number of objects being counted does not change during the process. Such measurements result in exact numbers. By counting the eggs in a carton, for instance, one can determine exactly how many eggs are there in the carton. Similarly, the numbers of defined quantities are also exact. For example, 1 foot is exactly 12 inches, 1 inch is exactly 2.54 centimeters, and 1 gram is exactly 0.001 kilograms. Quantities...

Uncertainty in Measurement: Accuracy and Precision

Uncertainty in Measurement: Accuracy and Precision

Scientists typically make repeated measurements of a quantity to ensure the quality of their findings and to evaluate both the precision and the accuracy of their results. Measurements are said to be precise if they yield very similar results when repeated in the same manner. A measurement is considered accurate if it yields a result that is very close to the true or the accepted value. Precise values agree with each other; accurate values agree with a true value.

Small-Signal Analysis of MOSFET Amplifiers

Small-Signal Analysis of MOSFET Amplifiers

In small-signal analysis, a MOSFET transistor amplifier acts as a linear amplifier when operating in its saturation region. The gate-to-source voltage (VGS) of the MOSFET is the sum of the DC biasing voltage and the small time-varying input signal. This combination sets up the operating point and modulates the drain current (ID) that flows from the drain to the source. When a small AC signal is superimposed on the DC bias voltage at the gate, the instantaneous drain current comprises three...

Uncertainty: Overview

Uncertainty: Overview

In analytical chemistry, we often perform repetitive measurements to detect and minimize inaccuracies caused by both determinate and indeterminate errors. Despite the cares we take, the presence of random errors means that repeated measurements almost never have exactly the same magnitude. The collective difference between these measurements - observed values - and the estimated or expected value is called uncertainty. Uncertainty is conventionally written after the estimated or expected value.

Small-Signal Analysis of BJT Amplifiers

Small-Signal Analysis of BJT Amplifiers

Small signal analysis is a fundamental approach used in electronics to understand how a Bipolar Junction Transistor (BJT) amplifier processes signals. In the active region, the BJT is designed for linear amplification. The transistor's behavior under these conditions is governed by its instantaneous base-emitter voltage VBE, a sum of the DC bias VBE, and a small AC signal VBE, resulting in the collector current iC. Here, the collector current has a DC component and an AC component.

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by

Same author

Measuring the permittivity of fused silica with planar on-wafer structures up to 325 GHz.

Applied physics letters·2024

Same author

A multifunctional smart field-programmable radio frequency surface.

Nature communications·2024

Same author

Respiration and Heart Rate Monitoring in Smart Homes: An Angular-Free Approach with an FMCW Radar.

Sensors (Basel, Switzerland)·2024

Same author

Applicability of the Meniscus-Removal Method for Q-Band Liquid Characterization in Semi-Open Waveguide Cell.

Sensors (Basel, Switzerland)·2023

Same author

Meniscus-Corrected Method for Broadband Liquid Permittivity Measurements with an Uncalibrated Vector Network Analyzer.

Sensors (Basel, Switzerland)·2023

Same author

Complex Dielectric Permittivity Spectra of Rapeseed in the 20 MHz-3 GHz Frequency Range.

Materials (Basel, Switzerland)·2022

Same journal

Optimal Series Resistors for On-Wafer Calibrations.

IEEE transactions on microwave theory and techniques·2026

Same journal

System-Level Calibration of a Millimeter-Wave Vector Signal Analyzer with Uncertainties.

IEEE transactions on microwave theory and techniques·2026

Same journal

Glass Microwave Microfluidic Devices for Broadband Characterization of Diverse Fluids.

IEEE transactions on microwave theory and techniques·2025

Same journal

A Wireless Artificial Mechanoreceptor in 180-nm CMOS.

IEEE transactions on microwave theory and techniques·2024

Same journal

An Improved Two-Port Transmission Line Permittivity and Permeability Determination Method With Shorted Sample.

IEEE transactions on microwave theory and techniques·2024

Same journal

Jitter Sensitivity Analysis of the Superconducting Josephson Arbitrary Waveform Synthesizer.

IEEE transactions on microwave theory and techniques·2024

See all related articles

Search research articles

Related Experiment Video

Updated: Nov 2, 2025

Intermediate Strain Rate Material Characterization with Digital Image Correlation

Intermediate Strain Rate Material Characterization with Digital Image Correlation

Published on: March 1, 2019

Uncertainty in Large-Signal Measurements Under Variable Load Conditions.

Konstanty Łukasik¹, Jerome Cheron², Gustavo Avolio³

¹Department of Electrical Engineering, University of Leuven, 3000 Leuven, Belgium, and also with the Institute of Electronic Systems, Department of Electronics and Information Technology, Warsaw University of Technology, 00-665 Warsaw, Poland.

IEEE Transactions on Microwave Theory and Techniques

|June 14, 2021

Summary

This summary is machine-generated.

Large-signal measurements of microwave transistors are affected by load variations. This study quantifies uncertainty in traveling voltage waves and their impact on transistor performance metrics.

Keywords:

Calibration large-signal measurements load–pull measurement uncertainty sensitivity analysis vector network analyzer

More Related Videos

Split Point Analysis and Uncertainty Quantification of Thermal-Optical Organic/Elemental Carbon Measurements

Split Point Analysis and Uncertainty Quantification of Thermal-Optical Organic/Elemental Carbon Measurements

Published on: September 7, 2019

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics

Published on: January 19, 2018

Related Experiment Videos

Last Updated: Nov 2, 2025

Intermediate Strain Rate Material Characterization with Digital Image Correlation

Intermediate Strain Rate Material Characterization with Digital Image Correlation

Published on: March 1, 2019

Split Point Analysis and Uncertainty Quantification of Thermal-Optical Organic/Elemental Carbon Measurements

Split Point Analysis and Uncertainty Quantification of Thermal-Optical Organic/Elemental Carbon Measurements

Published on: September 7, 2019

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics

Published on: January 19, 2018

Area of Science:

Electrical Engineering
Solid-State Physics

Background:

Accurate large-signal measurements are crucial for characterizing microwave transistors.
Variations in load conditions introduce significant uncertainty in measurement results.

Purpose of the Study:

To investigate the impact of varying load conditions on the uncertainty of large-signal microwave transistor measurements.
To evaluate uncertainties in complex frequency-domain traveling voltage waves.
To analyze how load reflection coefficient variations affect wave uncertainties and performance quantities.

Main Methods:

Analysis of uncertainty sources typical for large-signal measurements.
Evaluation of uncertainties in the magnitude and phase of traveling voltage waves.
Mathematical modeling of the dependency of wave uncertainty on the load reflection coefficient.

Main Results:

Uncertainty in traveling voltage waves is directly dependent on the load reflection coefficient.
The total uncertainty of the waves, including magnitude and phase, was quantified.
Identified unavoidable impact of these wave uncertainties on performance metrics like output power.

Conclusions:

Load condition variations are a primary source of uncertainty in large-signal microwave transistor measurements.
Understanding and quantifying wave uncertainty is essential for accurate transistor performance evaluation.
The findings provide a basis for improving measurement accuracy and device modeling.