Lossless Lines
Transmission-Line Differential Equations
Susceptibility, Permittivity and Dielectric Constant
Boundary Conditions: Lossless Lines
Lossy Lines and Overvoltages
Resistance and Conductance
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Recombination Dynamics in Thin-film Photovoltaic Materials via Time-resolved Microwave Conductivity
Published on: March 6, 2017
Derek A Houtz1, Dazhen Gu1, David K Walker1
1RF Technology Division, National Institute of Standards and Technology (NIST), Boulder, CO 80305 USA.
A new measurement technique improves the accuracy of complex permittivity and permeability determination. This method uses a shorted sample reflectivity measurement to reduce uncertainties caused by resonances in low-loss materials.
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