Deconvolution
Electron Microscope Tomography and Single-particle Reconstruction
Confocal Fluorescence Microscopy
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Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station
Published on: April 1, 2020
E Rotunno1, A H Tavabi2, P Rosi3
1Istituto di Nanoscienze - CNR, 41125 Modena, Italy.
A convolutional neural network precisely aligns an orbital angular momentum sorter in transmission electron microscopy. This accurate and fast method enables real-time tuning of electron optical devices and beam shaping.
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