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Updated: Oct 29, 2025

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics
Published on: January 19, 2018
Frequency-independent voltage amplitude across a tunnel junction
Simon Feigl1, Radovan Vranik1, Bareld Wit1
1Institute of Semiconductor and Solid State Physics, Johannes Kepler University Linz, 4040 Linz, Austria.
Abstract:
Radio-frequency (rf) scanning tunneling microscopy has recently been advanced to methods such as single-atom spin resonance. Such methods benefit from a frequency-independent rf voltage amplitude across the tunnel junction, which is challenging to achieve due to the strong frequency dependence of the rf attenuation in a transmission line. Two calibration methods for the rf amplitude have been reported to date. In this Note, we present an alternative method to achieve a frequency-independent rf voltage amplitude across the tunnel junction and show the results of this calibration. The presented procedure is applicable to devices that can deliver rf voltage to a tunnel junction.
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