Billion-pixel x-ray camera (BiPC-X)

Area of Science:

• X-ray imaging technology
• Solid-state physics
• Materials science

Background:

• Commercial complementary metal-oxide-semiconductor (CMOS) imaging sensors have seen significant improvements in quantum efficiency (>90%), noise reduction (<1 electron/pixel), and pixel pitch (<1 μm).
• These advancements create opportunities for developing novel, high-resolution x-ray imaging systems.

Purpose of the Study:

• To describe the design and construction of billion-pixel x-ray cameras (BiPC-X) utilizing tiled commercial CMOS sensors.
• To develop device models for both direct and indirect x-ray detection methods.
• To propose a modified Birks's law to explain light yield non-proportionality in scintillators.

Main Methods:

• Flexible tiling of commercial CMOS imaging sensors to create large-format detectors.
• Development of device models for direct detection (<10 keV x-rays) and indirect detection (using scintillators for higher energies).
• Experimental validation of single x-ray sensitivity and spatial resolution using laboratory and synchrotron x-ray sources.

Main Results:

• Successful construction of BiPC-X prototypes based on tiled CMOS sensors.
• Validated device models for x-ray detection.
• Experimental confirmation of single x-ray sensitivity and spatial resolution.
• Proposed modified Birks's law for scintillator characterization.

Conclusions:

• Billion-pixel x-ray cameras (BiPC-X) are feasible using advanced commercial CMOS sensors.
• These cameras provide high sensitivity and resolution for demanding x-ray applications.
• Potential applications span high-temperature plasma diagnostics, synchrotrons, and pulsed power facilities.