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Published on: October 1, 2019
Overall Profile Measurements of Tiny Parts with Complicated Features with the Cradle-Type Five-Axis System
Lei Liu1, Linlin Zhu1, Li Miao1
1State Key Laboratory of Precision Measuring Technology & Instruments, Laboratory of Micro/Nano Manufacturing Technology, Tianjin University, Tianjin 300072, China.
Abstract:
There are generally complex features with large curvature or narrow space on surfaces of complicated tiny parts, which makes high-precision measurements of their three-dimensional (3D) overall profiles a long-lasting industrial problem. This paper proposes a feasible measurement solution to this problem, by designing a cradle-type point-scanning five-axis measurement system. All the key technology of this system is also studied from the system construction to the actual measurement process, and the measurement accuracy is improved through error calibration and compensation. Finally, the feasibility is proved by engineering realization. The measurement capability of the system is verified by measuring workpieces such as cross cylinders and microtriangular pyramids.
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