An Instrument for the Characterization and Calibration of Optical Sensors

Area of Science:

• Optical sensor characterization
• Machine vision technology
• Electronic imaging systems

Background:

• Accurate electronic response characterization is crucial for optical sensor inspection and performance optimization.
• Existing methods may not meet stringent industry standards for uniformity and calibration.

Purpose of the Study:

• To develop a novel hardware/software system for comprehensive electronic response characterization of optical sensors.
• To ensure the system adheres to the latest EMVA 1288 standard (ver. 3.1).

Main Methods:

• Utilized an Ulbricht sphere for highly uniform illumination (>99.54%).
• Developed an innovative illuminator with precisely positioned LEDs and control electronics.
• Created a flexible C# software for analyzing sensor parameters.

Main Results:

• Achieved spatial non-uniformity of illumination below 3% and an f-number of 8.0.
• Successfully characterized parameters including Quantum Efficiency, Signal-to-Noise Ratio (SNRmax), and Dark Signal Non-Uniformity (DSNU1288).
• Enabled camera manufacturers to design, integrate, and inspect multiple camera models.

Conclusions:

• The developed instrument effectively meets the EMVA 1288 standard for optical sensor characterization.
• The system provides a robust solution for detailed analysis of sensor performance.
• This facilitates improved design, integration, and quality control in camera manufacturing.