Computational modeling for the evaluation of suppressed scintillation yields in plastic scintillators using Geant4

The yield of scintillation photons emitted from scintillators is considered to be proportional to the LET (linear energy transfer) which is energy distribution per unit length, in the low-LET domain, but not proportional in the high LET domain due to the suppression yield from the so-called quenching effect. Ogawa et al. proposed a computational method to estimate scintillation yield using Monte Carlo simulations considering the principle of the FRET (fluorescence resonance energy transfer) process, which is a phenomenon of energy transfer between fluorescent molecules. In their study, the track structure simulations could reproduce measured yields of scintillation. However, Ogawa et al.'s model was not suitable for estimating the scintillation yields when the particle energy was low when using condensed history simulations. Therefore, we propose a new method for estimating scintillation yields more accurately using Geant4 to improve the model calculations based on condensed history simulations. We simulated the local energy deposition pattern in a NE102A plastic scintillator to calculate the number of excitors in the microscopic volume for various nuclides (helium to argon ions). The suppressed scintillation yields were estimated using the model calculations of sequential FRET processes while considering the inactivation of the excitors selected as donors of the FRET process. The model calculations successfully reproduced the experimental scintillation yields within 10% error for the lighter ions up to neon. However, when the analysis was repeated for silicon and argon, the maximum error in the scintillation yields increased up to 27%. The proposed computational model for the evaluation of the suppressed scintillation yields emitted from NE102A scintillator irradiated with heavy ions using sequential FRET calculations with condensed history method returned simulated scintillation yields.