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Related Concept Videos

Atomic Emission Spectroscopy: Interference01:30

Atomic Emission Spectroscopy: Interference

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In atomic emission spectroscopy (AES), high-temperature atomizers excite a broad range of elements and molecules that generate complex emissions from sources such as oxides, hydroxides, and flame combustion products in the flame or plasma. Several strategies can be employed to minimize spectral interferences caused by overlapping emission lines or bands. These include increasing instrument resolution, choosing alternative emission lines, optimally placing the detector in low-background regions,...
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Interference and Diffraction02:18

Interference and Diffraction

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Interference is a characteristic phenomenon exhibited by waves. When two electromagnetic waves interact with their peaks and troughs coinciding, a resulting wave with enhanced amplitude is produced. This is known as constructive interference. In this case, the two waves interacting are in phase with each other.
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Atomic Absorption Spectroscopy: Interference01:25

Atomic Absorption Spectroscopy: Interference

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Interference leads to systematic error in atomic absorption (AA) measurements by enhancing or diminishing the analytical signal or the background. These interferences can be grouped into three main categories: spectral interference, chemical interference, and physical interference.
Spectral interference occurs when signals from other elements or molecules overlap with the analyte signal, falsely elevating or masking the analyte's absorbance. This interference can be corrected using Zeeman,...
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Atomic Emission Spectroscopy: Instrumentation01:22

Atomic Emission Spectroscopy: Instrumentation

714
The instrumentation of atomic emission spectrometry (AES) involves various components, including atomization devices that convert samples into gas-phase atoms and ions. There are two main types of atomization devices: continuous and discrete atomizers.  Continuous atomizers, like plasmas and flames, introduce samples in a constant stream, while discrete atomizers inject individual samples using syringes or autosamplers. The most common discrete atomizer is the electrothermal atomizer.
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Infrared (IR) Spectroscopy: Overview01:09

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When electromagnetic radiation passes through a material, atoms or molecules transition from a lower to a higher energy state by absorbing radiation corresponding to the energy difference between the two states. The absorption of infrared (IR) radiation causes transitions between vibrational energy levels in a molecule. Therefore, IR spectroscopy is a useful analytical tool for determining the molecular structure of molecules.
Different compounds display unique properties due to their...
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Atomic Emission Spectroscopy: Overview01:20

Atomic Emission Spectroscopy: Overview

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Atomic emission spectroscopy (AES) is an analytical technique used to determine the elemental composition of a sample by analyzing the light emitted from excited atoms. In AES, atoms in a sample are excited to higher energy levels by thermal energy from high-temperature sources, such as plasma, arcs, or sparks. When these excited atoms return to lower energy states, they emit light at specific wavelengths characteristic of each element. The resulting atomic emission spectrum, which consists of...
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Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating
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Event based coherence scanning interferometry.

Christian Schober, Christof Pruss, Andreas Faulhaber

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    Event-based image sensors offer a novel solution for coherence scanning interferometry, overcoming limitations of traditional digital cameras. This advancement enables high-speed, high-dynamic-range measurements for advanced metrology applications.

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    Area of Science:

    • Optical metrology
    • Advanced sensor technology

    Background:

    • Coherence scanning interferometry (CSI) is crucial for high-precision measurements in research and industry.
    • Traditional CSI systems using CCD/CMOS cameras have limitations with steep surfaces and broad spectra, leading to underutilized pixels and restricted dynamic range.
    • This inefficiency hinders achieving high scan speeds and broad measurement capabilities.

    Purpose of the Study:

    • To introduce and evaluate event-based image sensors as a superior alternative for coherence scanning interferometry.
    • To demonstrate the feasibility of event-based interferometry for enhanced measurement performance.

    Main Methods:

    • Developed a coherence scanning microscope incorporating an event-based image sensor.
    • Integrated the system with the nanopositioning and nanometrology machine (NPMM-200).
    • Investigated signal generation and data acquisition using the event-based sensor.

    Main Results:

    • Successfully demonstrated signal generation with the event-based sensor in a CSI setup.
    • Achieved promising initial measurements showcasing the potential of event-based interferometry.
    • The sensor's asynchronous, change-based data acquisition overcomes limitations of frame-based sensors.

    Conclusions:

    • Event-based image sensors represent a significant advancement for coherence scanning interferometry.
    • This technology enables higher dynamic range and faster scan speeds compared to conventional methods.
    • Event-based interferometry holds great promise for future high-performance metrology applications.