Confocal Fluorescence Microscopy
Total Internal Reflection Fluorescence Microscopy
Electron Microscope Tomography and Single-particle Reconstruction
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Lensfree On-chip Tomographic Microscopy Employing Multi-angle Illumination and Pixel Super-resolution
Published on: August 16, 2012
Optimal scanning in tomographic diffractive microscopy (TDM) is crucial for high-resolution, label-free imaging. This study found that 3D uniform scanning best fills Fourier space, improving image quality and refractive index estimation in reflection and 4Pi TDM systems.
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