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Updated: Oct 16, 2025

In situ Grazing Incidence Small Angle X-ray Scattering on Roll-To-Roll Coating of Organic Solar Cells with Laboratory X-ray Instrumentation
Published on: March 2, 2021
Grazing-incidence X-ray diffraction tomography for characterizing organic thin films
Esther H R Tsai1, Yu Xia2, Masafumi Fukuto3
1Center for Functional Nanomaterials, Brookhaven National Laboratory, Upton, NY 11973, USA.
Abstract:
Characterization of thin films is of paramount importance for evaluating material processing outcomes/efficiency as well as establishing structure-property/performance relationships. This article introduces grazing-incidence diffraction tomography (GID tomography), a technique that combines grazing-incidence X-ray scattering and computed tomography to quantitatively determine the dimension and orientation of crystalline domains in thin films without restrictions on the beam coherence, substrate type or film thickness. This computational method extends the capability of synchrotron beamlines by utilizing standard X-ray scattering experiment setups.
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