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Updated: Oct 16, 2025

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Defocused travelling fringes in a scanning triple-Laue X-ray interferometry setup

C P Sasso1, G Mana1,2, E Massa1

  • 1INRIM - Istituto Nazionale di Ricerca Metrologica, strada delle cacce 91, 10135 Torino, Italy.

Journal of Applied Crystallography
|October 20, 2021
PubMed

Keywords:
Si lattice parameterX-ray crystal densityX-ray interferometrydynamical theory of X-ray diffraction

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