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Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples
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Crystal bending in triple-Laue X-ray interferometry. Part II. Phase-contrast topography

E Massa1, G Mana1,2, C P Sasso1

  • 1INRIM, Istituto Nazionale di Ricerca Metrologica, Strada delle Cacce 91, 10135 Torino, Italy.

Journal of Applied Crystallography
|June 7, 2023
PubMed

Keywords:
bent crystalscrystal X-ray interferometrycrystal strainsmoiré imagesphase-contrast topographythin films

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