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Biasing a Junction Field Effect Transistor (JFET) is crucial for setting operational parameters and ensuring efficient functioning in electronic circuits. JFETs are characterized by using a single carrier type in N-channel or P-channel configurations, where the channel is surrounded by PN junctions. These junctions are central to the device's ability to control current flow.
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Study on Cross-Coupled-Based Sensing Circuits for Nonvolatile Flip-Flops Operating in Near/Subthreshold Voltage

Taehui Na1

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Summary

This study introduces a novel cross-coupled NMOS-based sensing circuit (CCN-SC) for nonvolatile flip-flops (NV-FFs). The CCN-SC significantly enhances restore yield in near/subthreshold voltage regions, outperforming complex designs.

Keywords:
low voltagenonvolatile flip-flopsensing circuit

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Area of Science:

  • Electrical Engineering
  • Computer Engineering

Background:

  • Traditional nonvolatile flip-flop (NV-FF) designs often employ complex circuits for offset cancellation.
  • These complex designs, particularly those using switches, are inefficient for offset cancellation in near/subthreshold voltage regions, as switches exacerbate offset voltage issues.

Purpose of the Study:

  • To propose a novel and simplified sensing circuit for NV-FFs operating in low voltage regions.
  • To improve the restore yield of NV-FFs by addressing the limitations of complex offset cancellation designs.

Main Methods:

  • Introduction of a cross-coupled NMOS-based sensing circuit (CCN-SC).
  • The proposed design adheres to a 'simplest is the best' philosophy for improved performance.
  • Experimental validation using a 65 nm test chip.

Main Results:

  • The CCN-SC demonstrated a restore yield improvement of over 25 times at a 0.35 V supply voltage compared to cross-coupled inverter-based sensing circuits.
  • This improvement was achieved in NV-FFs operating in the near/subthreshold voltage region.
  • The proposed circuit exhibited 18 times higher power consumption.

Conclusions:

  • The novel CCN-SC offers a significant improvement in restore yield for NV-FFs at low operating voltages.
  • The simplified design approach proves effective where complex methods fail.
  • While power consumption is higher, the yield enhancement addresses a critical challenge in subthreshold operation.