High Breakdown Current Density in Quasi-1D van der Waals Layered Material Ta₂NiSe₇

We synthesized ternary composition chalcogenide Ta₂NiSe₇, a quasi-one-dimensional (Q1D) material with excellent crystallinity. To utilize the excellent electrical conductivity property of Ta₂NiSe₇, the breakdown current density (J_BD) according to thickness change through mechanical exfoliation was measured. It was confirmed that as the thickness decreased, the maximum breakdown voltage (V_BD) increased, and at 18 nm thickness, 35 MA cm^-2 of J_BD was measured, which was 35 times higher than that of copper, which is commonly used as an interconnect material. By optimization of the exfoliation process, it is expected that through a theoretical model fitting, the J_BD can be increased to about 356 MA cm^-2. It is expected that the low-dimensional materials with ternary compositions proposed through this experiment can be used as candidates for current-carrying materials that are required for the miniaturization of various electronic devices.