Ferromagnetism
Electrostatic Boundary Conditions in Dielectrics
Metal-Semiconductor Junctions
Biasing of Metal-Semiconductor Junctions
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Updated: Oct 13, 2025

A Fabrication and Measurement Method for a Flexible Ferroelectric Element Based on Van Der Waals Heteroepitaxy
Published on: April 8, 2018
Wanrong Geng1,2, Yujia Wang3, Yunlong Tang3
1Songshan Lake Materials Laboratory, Dongguan, Guangdong 523808, China.
Researchers engineered tunable flexoelectric effects at the atomic scale in bismuth ferrite (BiFeO3) thin films. This was achieved by controlling strain gradients from interfacial dislocations, opening new avenues for functional materials.
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