You might also read
Articles linked to this work by shared authors, journal, and citation graph.
Updated: Oct 13, 2025

Preparation of Nanoparticles for ToF-SIMS and XPS Analysis
Published on: September 13, 2020
Jiangtao Qu1, Wenjie Yang2, Tianhao Wu3
1Australian Centre for Microscopy & Microanalysis.
Researchers developed three methods for preparing nanomaterial specimens for atom probe tomography. This technique reveals atomic-scale material positions, crucial for understanding nanoparticle functionality in applications like lithium-ion batteries.
Area of Science:
Background:
Purpose of the Study:
Main Methods:
Main Results:
Conclusions: