Analysis of non-idealities in rhomb compensators

Area of Science:

• Optical Engineering
• Materials Science

Background:

• Rhombs are used as optical compensators in spectroscopic polarimetry and Mueller matrix spectroscopic ellipsometry.
• These devices utilize multiple total internal reflections to induce phase shifts for orthogonal optical electric field components.

Purpose of the Study:

• To develop a framework for characterizing non-idealities in rhomb performance.
• To analyze the impact of dissipation, dichroism, and stress-induced birefringence on rhomb compensators.

Main Methods:

• Developed a framework for characterizing non-idealities in rhombs.
• Employed external oblique reflection measurements using spectroscopic ellipsometry.
• Utilized simulations to analyze stress effects on polarization modification.
• Applied the framework to Mueller matrix measurements of a three-reflection rhomb.

Main Results:

• Characterized dichroic effects and retardance from reflections.
• Demonstrated that stress contributions depend on accumulated retardance and stress axis angle.
• Successfully fitted measurements by deducing stress parameters for each beam path.

Conclusions:

• The developed framework enables a complete description of rhomb polarization properties.
• Device geometry, optical structure, and stress parameters are deduced through the analysis.
• This work enhances the performance and application of rhombs as optical compensators.