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Updated: Oct 8, 2025

Implementation of a Reference Interferometer for Nanodetection
Published on: April 26, 2014
Laser frequency measurement in the short-wavelength region using an intermediate laser and a frequency noise
Abstract:
Optical frequency combs play a crucial role supporting optical frequency standards and cover a wide range of wavelengths (octaves). However, broadening the comb spectrum to the short-wavelength visible region (λ < 500 nm), where GaN-based blue diode lasers are available, is not an easy task. In this study, we propose a method for measuring the laser frequency in the short-wavelength region using an intermediate laser and a noise-canceling scheme. We demonstrate this method by measuring the frequency of a GaN-based laser at 399 nm and confirming that the frequency measurement is not affected by the frequency noise of the intermediate laser.

