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Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
Published on: December 5, 2015
Xianglong Miao1, Ting Shan Luk2, Peter Q Liu1
1Department of Electrical Engineering, University at Buffalo, The State University of New York, Buffalo, NY, 14260, USA.
This study introduces novel nanopatch antenna sensors with a liquid gallium ground plane for highly sensitive surface-enhanced infrared absorption (SEIRA) spectroscopy. These sensors enable efficient analyte delivery to nanometric hot spots for advanced chemical detection.
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