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Array Tomography Workflow for the Targeted Acquisition of Volume Information using Scanning Electron Microscopy
Published on: July 15, 2021
Quoc Hoan Tran1, Kohei Nakajima1,2
1Graduate School of Information Science and Technology, The University of Tokyo, Tokyo 113-8656, Japan.
We present a new machine learning method for quantum device tomography, enabling efficient characterization of quantum states over time. This approach addresses challenges in quantum control and temporal processing for future quantum technologies.
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