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Application of Murphy - Good Plot Parameters Extraction Method on Electron Emission from Carbon Fibers
Mazen A Madanat1, Ahmed A Al-Tabbakh2, Mohammed Alsa'eed3
1Light Metal Alloys Research Unit, Advanced Research Centre, Royal Scientific Society, Amman, 11941, Jordan; Surface Physics and Materials Technology Lab., Department of Physics, Mutah University, Al-Karak 61710, Jordan.
Ultramicroscopy
|February 17, 2022
Summary
This study compares two methods for extracting physical parameters from field electron emitters, specifically carbon fibers. The Fowler-Nordheim plot analysis provides insights into field electron emission mechanisms.
Area of Science:
- Materials Science
- Physics
- Surface Science
Background:
- Fowler-Nordheim (FN) plots are crucial for determining physical parameters of field electron emitters.
- Accurate extraction of these parameters is essential for understanding and optimizing electron emission devices.
Purpose of the Study:
- To apply and compare two parameter extraction methods: the Murphy-Good plot and the conventional Fowler-Nordheim plot iterative method.
- To analyze field emission data from carbon fiber (CF) bundles within a nickel tube setup.
- To investigate the physical parameters including emission area and voltage conversion length.
Main Methods:
- Utilized field emission microscopy setup.
- Applied Murphy-Good plot analysis.
- Employed Fowler-Nordheim plot iterative method for parameter extraction.
Main Results:
- Extracted key physical parameters such as area extraction parameter, notional emission area, formal area efficiency factor, and voltage conversion length.
- Compared results from both extraction methods to address their controversial nature.
- Analyzed the field electron emission mechanism based on the obtained parameters.
Conclusions:
- The study provides a comparative analysis of two FN plot-based methods for parameter extraction from carbon fiber emitters.
- The extracted parameters offer insights into the field electron emission mechanism.
- Results contribute to a better understanding of the reliability and application of these parameter extraction techniques.
