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Updated: Sep 30, 2025

Picometer-Precision Atomic Position Tracking through Electron Microscopy
Published on: July 3, 2021
Sihan Wang1, Tim B Eldred2, Jacob G Smith1
1Department of Materials Science and Engineering, North Carolina State University, Raleigh, NC 27695, United States.
This study presents an automated method for analyzing four-dimensional scanning transmission electron microscopy (4D-STEM) data. The technique accurately measures lattice strain in materials, even with noisy or complex diffraction patterns.
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