Overview of Microscopy Techniques
Confocal Fluorescence Microscopy
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Updated: Sep 30, 2025

Author Spotlight: Introduction to Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays
Published on: June 13, 2023
Gwangmook Kim1,2,3,4, Eoh Jin Kim1,2,3, Hyung Wan Do1,2,4
1Department of Materials Science and Engineering, Yonsei University, Seoul, 03722, Republic of Korea.
A new probe-based imaging method enables high-throughput nanoscale imaging. This technique uses scalable, cantilever-free elastomeric probes and a hierarchical architecture for rapid, high-resolution topography reconstruction.
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