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Updated: Sep 26, 2025
Recombination Dynamics in Thin-film Photovoltaic Materials via Time-resolved Microwave Conductivity
Published on: March 6, 2017
Surface Recombination and Space-Charge-Limited Photocurrent-Voltage (PC-V) Measurements in (Cd,Mn)Te Samples-Kinetics
Andrzej Mycielski1, Dominika M Kochanowska1, Aneta Wardak1
1Institute of Physics, Polish Academy of Sciences, Aleja Lotników 32/46, 02-668 Warsaw, Poland.
Abstract:
Photocurrent-voltage characteristic (PC-V) is a method of determining the critical parameter in X-ray and gamma-ray detector plates, i.e., the carrier mobility-lifetime product, μτ. We show for the (Cd,Mn)Te samples that the measurement results depend strongly on the surface treatment and the space charge distribution. The PC-V characteristics obtained for ħω > Eg and ħω ~ Eg indicated that etching with 20% HCl caused an appearance of a significant concentration of very shallow surface traps at the (Cd,Mn)Te sample surface. These traps seriously changed the results of measurements of PC-V characteristics and PC kinetics. We also noticed a small contribution of holes to photoconductivity in the PC kinetics. The measurements of PC-V characteristics for ħω > Eg may test the detector plate surface quality.
