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Photo-induced force microscopy (PiFM) - principles and implementations
Abid Anjum Sifat1, Junghoon Jahng2, Eric O Potma1,3
1Department of Electrical Engineering and Computer Science, University of California, Irvine, CA, USA.
Chemical Society Reviews
|May 5, 2022
Summary
Photo-induced force microscopy (PiFM) provides nanoscale spectroscopic imaging by detecting tiny forces generated by light. This technique has evolved into a versatile tool for various scientific applications.
Area of Science:
- Nanoscience and Spectroscopy
- Advanced Microscopy Techniques
Background:
- Photo-induced force microscopy (PiFM) is a scanning probe technique.
- It provides spectroscopic contrast at nanometer spatial resolution.
Purpose of the Study:
- To review technical implementations of PiFM.
- To discuss the physical origin of the PiFM signal.
Main Methods:
- Utilizes the enhanced near field at a sharp tip to induce local sample polarization.
- Detects photo-induced forces (pN range) from cantilever oscillation properties.
- Generates photo-induced force maps.
Main Results:
- PiFM offers high-resolution spectroscopic imaging.
- The technique has seen expanded imaging capabilities and applications since 2010.
- Signal origins include dipole-dipole forces and photothermal processes.
Conclusions:
- PiFM is a valuable nano-spectroscopic tool.
- Understanding its signal origins enhances its application.
- Ongoing development expands its utility in scientific research.
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