High-resolution electron time-of-flight spectrometers for angle-resolved measurements at the SQS Instrument at the

Alberto De Fanis1, Markus Ilchen1, Alexander Achner1

  • 1European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany.

Summary

New electron time-of-flight spectrometers achieve high-resolution angle-resolved spectroscopy at the European XFEL. This advancement offers enhanced capabilities for studying atomic-like quantum systems with unprecedented detail.

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