Field Effect Transistor
Biasing of FET
MOSFET: Enhancement Mode
Biasing of Metal-Semiconductor Junctions
MOSFET
Metal-Semiconductor Junctions
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A Fabrication and Measurement Method for a Flexible Ferroelectric Element Based on Van Der Waals Heteroepitaxy
Published on: April 8, 2018
Sungpyo Baek1, Hyun Ho Yoo1, Jae Hyeok Ju1
1SKKU Advanced Institute of Nanotechnology (SAINT), Sungkyunkwan University, Suwon, 440-746, Korea.
Ferroelectric field-effect transistors (Fe-FETs) using a novel van der Waals heterostructure demonstrate enhanced memory performance. This breakthrough offers a promising path for energy-efficient data-centric computing and artificial intelligence hardware.
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