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SPIE Computer-Aided Diagnosis conference anniversary review
Ronald M Summers1, Maryellen L Giger2
1National Institutes of Health, Radiology and Imaging Sciences, Clinical Center, Bethesda, Maryland, United States.
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The SPIE Computer-Aided Diagnosis conference has been held for 16 consecutive years at the annual SPIE Medical Imaging symposium. The conference remains vibrant, with a core group of submitters as well as new submitters and attendees each year. Recent developments include a marked shift in submissions relating to the artificial intelligence revolution in medical image analysis. This review describes the topics and trends observed in research presented at the Computer-Aided Diagnosis conference as part of the 50th-anniversary celebration of SPIE Medical Imaging.
