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Thin Polymer Film Force Spectroscopy: Single Chain Pull-out and Desorption.
Jake McClements1, Vasileios Koutsos1
1School of Engineering, Institute for Materials and Processes, The University of Edinburgh, Sanderson Building, King's Buildings, Edinburgh EH9 3FB, United Kingdom.
ACS Macro Letters
|May 31, 2022
Summary
Atomic force microscopy revealed forces of 20-25 pN for polymer chain pull-out. Desorption forces varied by substrate, being strongest on graphite and weakest on mica, indicating structural insights.
Area of Science:
- Polymer Science
- Surface Science
- Materials Science
Background:
- Understanding polymer thin film behavior is crucial for material design.
- Poly(styrene-co-butadiene) is a widely used random copolymer with diverse applications.
- Investigating interfacial forces provides insights into thin film structure and adhesion.
Purpose of the Study:
- To measure the forces of chain pull-out and single chain desorption in poly(styrene-co-butadiene) thin films.
- To correlate these forces with different substrate materials (mica, silicon, graphite).
- To elucidate the relationship between substrate properties, adhesion, and polymer film structure.
Main Methods:
- Utilized Atomic Force Microscopy (AFM) to probe single polymer chain interactions.
- Performed force measurements during tip retraction from copolymer thin films.
- Calculated the work of adhesion and considered substrate hydrophobicity.
Main Results:
- Observed common chain pull-out events with forces in the range of 20-25 pN.
- Found polymer desorption force to be strongest on graphite and weakest on mica.
- Demonstrated a systematic order of pull-out and desorption phenomena during tip retraction.
Conclusions:
- Substrate properties significantly influence polymer desorption forces.
- The work of adhesion and substrate hydrophobicity correlate with observed desorption forces.
- The sequence of interfacial events provides valuable information about the structure of polymer thin films.

