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In Situ Transmission Electron Microscopy with Biasing and Fabrication of Asymmetric Crossbars Based on Mixed-Phased a-VOx
Published on: May 13, 2020
Kannan Udaya Mohanan1, Seongjae Cho2, Byung-Gook Park3
1Department of Electronic Engineering and College of IT Convergence Engineering, Gachon University, Seongnam-si, Gyeonggi-do, 13120, Republic of Korea.
This study demonstrates a robust resistive-switching random-access memory (ReRAM) synapse for processing-in-memory (PIM) systems. The developed ReRAM synapse enhances device reliability and enables efficient, low-power artificial intelligence hardware.
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