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Broadband photodetector based on SnTe nanofilm/n-Ge heterostructure
Liyuan Song1,2,3, Libin Tang1,2,3, Qun Hao1
1The Laboratory of Photonics Information Technology, Ministry of Industry and Information Technology, School of Optics and Photonics, Beijing Institute of Technology, Beijing 100081, People's Republic of China.
Abstract:
Combining novel two-dimensional materials with traditional semiconductors to form heterostructures for photoelectric detection have attracted great attention due to their excellent photoelectric properties. In this study, we reported the formation of a heterostructure comprising of tin telluride (SnTe) and germanium (Ge) by a simple and efficient one-step magnetron sputtering technique. A photodetector was fabricated by sputtering a nanofilm of SnTe on to a pre-masked n-Ge substrate.J-Vmeasurements obtained from the SnTe/n-Ge photodetector demonstrated diode and photovoltaic characteristics in the visible to near-infrared (NIR) band (i.e. 400-2050 nm). Under NIR illumination at 850 nm with an optical power density of 13.81 mW cm-2, the SnTe/n-Ge photodetector exhibited a small open-circuit voltage of 0.05 V. It also attained a high responsivity (R) and detectivity (D*) of 617.34 mA W-1(at bias voltage of -0.5 V) and 2.33 × 1011cmHz1/2W-1(at zero bias), respectively. Therefore, SnTe nanofilm/n-Ge heterostructure is highly suitable for used as low-power broadband photodetector due to its excellent performances and simple device configuration.

