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Abdollah Pil-Ali1,2, Sahar Adnani1,2, Christopher C Scott3
1Department of Electrical and Computer Engineering, University of Waterloo, 200 University Ave W, Waterloo, ON N2L 3G1, Canada.
This study explored high-resolution direct conversion X-ray detectors for phase-contrast imaging. Edge illumination X-ray phase-contrast imaging (EI-XPCi) showed superior performance, but requires careful mask quality control.
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