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An FPGA-based system for generalised electron devices testing.

Patrick Foster1, Jinqi Huang2, Alex Serb3,4

  • 1Centre for Electronics Frontiers, Zepler Institiute, University of Southampton, Southampton, UK. p.foster@soton.ac.uk.

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This summary is machine-generated.

A new FPGA system offers a versatile, compact, and affordable solution for testing complex electronic components. This system provides a 64-channel source-meter unit and digital I/O, enabling efficient characterization of modern electronic devices.

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Area of Science:

  • Electrical Engineering
  • Materials Science
  • Computer Engineering

Background:

  • The increasing ubiquity of electronic systems and complexity of new components necessitate advanced testing solutions.
  • Traditional lab instruments like oscilloscopes and signal generators face limitations with high pin counts and parallel testing needs.

Purpose of the Study:

  • To describe and benchmark a Field-Programmable Gate Array (FPGA) based system for versatile electronic testing.
  • To introduce a compact, multi-functional instrument addressing the growing demand for efficient component characterization.

Main Methods:

  • Development and implementation of a general-purpose FPGA testing system.
  • Integration of a 64-channel source-meter unit and digital input/output (I/O) banks.
  • Benchmarking performance metrics including current noise floor, pulse delivery, and current drive capabilities.

Main Results:

  • The FPGA system achieved a current noise floor of [Formula: see text] and pulse delivery at [Formula: see text].
  • Demonstrated [Formula: see text] maximum current drive per channel.
  • Successfully performed current-voltage characterization, memristor array read-out, and digital-to-analog converter (DAC) non-linearity testing.

Conclusions:

  • The developed FPGA system provides a down-scaled electronics laboratory within a single instrument.
  • This approach offers a more affordable, reliable, and compact alternative for emerging electronic technologies.
  • The system facilitates efficient and parallel testing of complex electronic components.