Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Concept Videos

Atomic Force Microscopy01:08

Atomic Force Microscopy

3.5K
Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
3.5K
Overview of Microscopy Techniques01:22

Overview of Microscopy Techniques

11.0K
The early pioneers of microscopy opened a window into the invisible world of microorganisms. In 1830, Joseph Jackson Lister created an essentially modern light microscope. The 20th century saw the development of microscopes that leveraged nonvisible light, such as fluorescence microscopy that uses an ultraviolet light source and electron microscopy that uses short-wavelength electron beams. These advances significantly improved magnification, image resolution, and contrast. By comparison, the...
11.0K
Standing Waves in a Cavity01:28

Standing Waves in a Cavity

1.0K
A household microwave and lasers are examples of standing electromagnetic waves in a cavity. When two conducting metal plates are placed parallel at the nodal planes, it creates a cavity where standing waves are formed. The cavity between the two planes is analogous to a stretched string held at the points x = 0 and x = L. Here, the distance 'L' between the two planes must be an integer multiple of half of the wavelength. The wavelengths that satisfy this condition are given by:
1.0K

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

A Miniaturized Microwave Magnetometer with High Frequency Resolution Based on Diamond NV Centers for Multi-Microwave-Field Measurement.

Micromachines·2026
Same author

Microwave Near Field Imaging of Externally Injected Signals in an Encapsulated Electronic Device.

Micromachines·2026
Same author

Laser-Assisted Diamond Cutting for Low-Damage Fabrication of High-Q CaF<sub>2</sub> Whispering-Gallery Mode Resonators.

Micromachines·2026
Same author

Laser-Assisted Diamond Turning for Anisotropy Suppression in Calcium Fluoride.

Micromachines·2026
Same author

Denoising Method for NV-Center Fluorescence Signals Based on MPA-VMD Combined with Wavelet Thresholding.

Micromachines·2026
Same author

Sensitivity Improvement via Differential Detection for Frequency-Locking Diamond Magnetometers.

Micromachines·2025

Related Experiment Video

Updated: Aug 30, 2025

Recombination Dynamics in Thin-film Photovoltaic Materials via Time-resolved Microwave Conductivity
11:30

Recombination Dynamics in Thin-film Photovoltaic Materials via Time-resolved Microwave Conductivity

Published on: March 6, 2017

11.8K

Developments of Interfacial Measurement Using Cavity Scanning Microwave Microscopy.

Zhenrong Zhang1,2,3, Huanfei Wen1,2,3, Liangjie Li1,2,3

  • 1Key Laboratory of Instrument Science and Dynamic Testing Ministry of Education, North University of China, Taiyuan 030051, China.

Scanning
|August 26, 2022
PubMed
Summary
This summary is machine-generated.

Scanning microwave microscopy offers high-sensitivity, nondestructive material analysis. This review covers its theory, applications, and recent advances in resolution and frequency for future research.

More Related Videos

Implementation of a Reference Interferometer for Nanodetection
16:11

Implementation of a Reference Interferometer for Nanodetection

Published on: April 26, 2014

9.4K
Characterization of Surface Modifications by White Light Interferometry: Applications in Ion Sputtering, Laser Ablation, and Tribology Experiments
11:47

Characterization of Surface Modifications by White Light Interferometry: Applications in Ion Sputtering, Laser Ablation, and Tribology Experiments

Published on: February 27, 2013

15.7K

Related Experiment Videos

Last Updated: Aug 30, 2025

Recombination Dynamics in Thin-film Photovoltaic Materials via Time-resolved Microwave Conductivity
11:30

Recombination Dynamics in Thin-film Photovoltaic Materials via Time-resolved Microwave Conductivity

Published on: March 6, 2017

11.8K
Implementation of a Reference Interferometer for Nanodetection
16:11

Implementation of a Reference Interferometer for Nanodetection

Published on: April 26, 2014

9.4K
Characterization of Surface Modifications by White Light Interferometry: Applications in Ion Sputtering, Laser Ablation, and Tribology Experiments
11:47

Characterization of Surface Modifications by White Light Interferometry: Applications in Ion Sputtering, Laser Ablation, and Tribology Experiments

Published on: February 27, 2013

15.7K

Area of Science:

  • Materials Science
  • Physics

Background:

  • Scanning microwave microscopy is a crucial tool in materials research.
  • It provides high sensitivity and nondestructive testing capabilities for various samples.

Purpose of the Study:

  • To review the theoretical and fundamental aspects of microwave imaging.
  • To explore the diverse applications of microwave imaging.
  • To discuss recent advancements and future prospects of scanning microwave microscopy.

Main Methods:

  • Review of theoretical and fundamental components of microwave imaging.
  • Analysis of direct investigation capabilities for semiconductor devices, electromagnetic fields, and ferroelectric domains.
  • Examination of recent progress in resolution and operating frequency.

Main Results:

  • Microwave microscopy allows direct investigation of material properties, moving beyond indirect measurements.
  • Recent advances have improved resolution and operating frequencies in scanning microwave microscopy.
  • The technology has a wide range of current and potential future applications.

Conclusions:

  • Scanning microwave microscopy is a powerful technique for materials research.
  • Continued advancements in resolution and frequency will expand its utility.
  • Future applications are anticipated in both industrial and academic settings.